Fischione puts finishing touches on applications labs

April 30, 2009

The Fischione Instruments Applications Laboratories are finished.

The four-room laboratory suite features:

  • The full complement of Fischione Instruments specimen preparation products, including the Model 1030 Automated Specimen Preparation (ASaP) System, the Model 1040 NanoMill® TEM specimen preparation system, the Model 1050 TEM Mill, the Model 1060 SEM Mill, and the Model 1070 NanoClean plasma cleaner.
  • CM200 FEG transmission electron microscope
  • Hitachi S-4700 FE scanning electron microscope
  • Hitachi Model FB-2000A focused ion beam (FIB) system. 

This range of instrumentation allows virtually any type of TEM or SEM sample to be readily prepared.