April 30, 2009
The Fischione Instruments Applications Laboratories are finished.
The four-room laboratory suite features:
- The full complement of Fischione Instruments specimen preparation products, including the Model 1030 Automated Specimen Preparation (ASaP) System, the Model 1040 NanoMill® TEM specimen preparation system, the Model 1050 TEM Mill, the Model 1060 SEM Mill, and the Model 1070 NanoClean plasma cleaner.
- CM200 FEG transmission electron microscope
- Hitachi S-4700 FE scanning electron microscope
- Hitachi Model FB-2000A focused ion beam (FIB) system.
This range of instrumentation allows virtually any type of TEM or SEM sample to be readily prepared.