The industry standard for producing high-quality thin foils
for transmission electron microscopy. The twin jets simultaneously
polish both sides of the sample, creating electron transparent
specimens within a few minutes. Easily adjusted electrolyte
flow, polishing voltage, detection sensitivity, jet, and specimen
Electropolishing accessories include the Model 220 Low Temperature
Container, the Model 130 Specimen Punch, and the Model 140
Digital Power Control.
160 Specimen Grinder
Produces specimens of uniform thickness and parallel sides
within a few minutes. Easily and precisely controlled. During
the grinding process, a graduated dial continuously indicates
the specimen thickness.
170 Ultrasonic Disk Cutter
Cut TEM specimens from hard, brittle materials without mechanical
or thermal damage. Unique design means that the sample is
always presented parallel to the cutting axis. Process is
automatically terminated once the specimen has been cut.
Optional microscope enables site-specific cutting. Highly
effective for cutting disk, cylindrical, or rectangular
XTEM Preparation Kit
The Model 180 XTEM Prep Kit is designed to produce controlled
cross-section TEM (XTEM) specimens. Widely used cross-section
samples include semiconductor devices which often have multiple
layers and thus multiple interfaces, specimens with thin film
layers, and composite materials.
Provides a clean environment for SEM sample imaging and analysis. Contaminants condense onto a removable, cold surface that can be regenerated and reused. The SEM can be used while the Cryo-Can is cooled, even on SEMs without airlocks.
200 Dimpling Grinder
State-of-the-art mechanical grinder for preparing electron microscopy
samples. Features grinding rate control, precise indication
of specimen thickness, and easy-to-use graphical interface.
Accepts mounted specimens from the Model 160 Specimen Grinder.
1010 Ion Mill
A tabletop, PC-controlled precision ion mill and polisher for
creating high-quality electron transparent TEM specimens. Fully
programmable operation. Uses two independently adjust-able,
variable energy hollow anode discharge (HAD) ion sources, liquid
nitrogen specimen cooling, low angle milling capabilities, automatic
gas control, and an oil-free vacuum system for ultra-clean specimen
1020 Plasma Cleaner (U.S. Patent 5,633,502)
Automatically and quickly removes organic contamination from
electron microscopy specimens and specimen holders. A low energy,
reactive gas plasma cleans without changing the specimen’s
elemental composition or structural characteristics. Readily
accepts side-entry specimen holders for all commercial TEMs
as well as SEM samples and a wide variety of bulk materials.
Features an oil-free vacuum system for optimal processing.
1030 Automated Sample Prep (ASaP) System (Patent Pending)
Powerful, rapid, and flexible tool that significantly enhances
the image quality and analytical data derived from SEM and TEM
specimens. Combines the features of plasma cleaning, ion beam
etching (IBE), reactive ion
etching (RIE), and ion beam sputter coating (IBSC). Specimen is
under continuous vacuum throughout the preparation process.
1040 NanoMill® TEM specimen preparation system (U.S. Patents 7,132,673 and 7,504,623)
Ultra-low-energy, concentrated ion beam is ideal for preparing today’s
specimens of advanced materials for TEM imaging and analysis.
Unique ion beam technology produces specimens free from amorphous
and implanted layers. The NanoMill® System is capable of post-FIB (focused
ion beam) processing and the enhancement of conventionally-prepared specimens.
It is flexible, easily programmable, and ideally suited for
NanoMill® is a registered trademark of E.A. Fischione Instruments, Inc.
3000 Annular Dark Field Detector
For high resolution STEM imaging. Allows simultaneous high angle
annular dark field imaging and electron energy less spectroscopy.
Single electron detection capability
and high quantum efficiency. The
detector is pneumatically retractable
from the beam path.