Simultaneously cleans EM specimens and holders
The Model 1020 Plasma Cleaner automatically and quickly removes
organic contamination (hydrocarbon) from electron microscopy
(EM) specimens and specimen holders. A low energy, reactive
gas plasma cleans without changing the specimen’s elemental
composition or structural characteristics. The Model 1020
features easy-to-use front panel controls and an oil-free
vacuum system for optimal processing.
Enhanced imaging and analysis
Cleaning is solely by reactive gas compounds formed by the
plasma chemically reacting with carbonaceous material on the
specimen and specimen holder. The nonequilibrium, high frequency
plasma is generated with a gas mixture of 25% oxygen and 75%
argon. Free electrons are accelerated to high velocities by
an oscillating electromagnetic field (13.56 MHz) that excites
gas atoms and creates the plasma. The plasma ions impinge
upon the surface with energies of less than 12eV, which is
below the specimen’s sputtering threshold.
In electron microscopes with high brightness electron sources,
specimens that are not plasma treated tend to contaminate.
The Model 1020 Plasma Cleaner ensures confidence that carbonaceous
contamination will not interfere with imaging or analysis,
even during fine probe microanalysis for extended periods.
Standard and specialized specimen
The Plasma Cleaner readily accepts side-entry specimen holders
for all commercial TEMs as well as SEM samples and a wide
variety of bulk materials. A specialized specimen holder port
allows the cleaning of specimens contained on carbon grids.
Vacuum Storage Container
Vacuum Pumping Station
Model 9010 Vacuum Storage Container. After
cleaning, specimen holders can be inserted into Model 9010
Vacuum Storage Containers so that they can be stored or transported
in a vacuum.
Model 9020 Vacuum Pumping Station simultaneously
stores five specimen holders under vacuum.