The Model 1070 features an easy-to-use touchscreen embedded module that allows the user to control individual instrument functions such as delivered power, chamber pressure, gas mixture, and process time. For dedicated cleaning of EM specimens and holders, the Model 1070 includes a recipe that yields optimal plasma processing conditions. Other recipes are available for applications such as enhancing the hydrophilic properties of biological support grids.
Standard and specialized specimen holders
Enhanced imaging and analysis
Cleaning is solely by reactive gas compounds formed by the plasma chemically reacting with carbonaceous material on the specimen and specimen holder. A low-energy, inductively coupled, high frequency (HF), downstream plasma effectively cleans the specimen surface without changing its elemental composition or structural characteristics.
In electron microscopes with high brightness electron sources, specimens that are not plasma treated tend to contaminate. The Model 1070 NanoClean ensures confidence that carbonaceous contamination will not interfere with imaging or analysis, even during fine probe microanalysis for extended periods. Highly contaminated specimens can be cleaned in two minutes or less.
The vacuum system for the Model 1070 is oil-free. The chamber includes a load lock for rapid specimen exchange making the Model 1070 ideal for high throughput applications. The Model 1070 contains three mass flow controllers and is designed to accept multiple gases. Typically, the time-proven gas mixture of 25% oxygen and 75% argon is connected to one of the gas inlets. The Model 1070 is fitted with two additional gas inlets which accept gas supplies that can be blended using the Model 1070's internal mass flow technology. An automatic matching network ensures that the high frequency power is effectively coupled to the plasma and the delivered power is suited for the application. The matching network regulates plasma power for a variety of conditions, objects to be processed, or gases employed.
The Model 1070 readily accepts one or two side-entry specimen holders for all commercial TEMs, STEMs, and SEMs. An additional port allows large, bulk objects to be placed in the chamber for processing. This is ideal for scanning electron microscopy (SEM) or surface science applications. A specialized specimen holder port allows the cleaning of specimens contained on carbon grids.