High-resolution STEM imaging
The Model 3000 Annular Dark Field (ADF) Detector is ideal
for high-resolution scanning transmission electron microscopy
(STEM) imaging. It allows simultaneous high angle ADF imaging
and electron energy less spectroscopy (EELS). It has single
electron detection capabilities and high quantum efficiency.
The detector is pneumatically retractable from the beam path.
Atomic-resolution imaging and Z-contrast
High angle ADF STEM images are formed by collecting electrons
that have been forward scattered through high angles. For
high angles, elastic and inelastic interactions between the
incident electrons and the columns of atoms within the specimen
produce image contrast. Since the nuclei of the target atoms
are involved, the strength of scattering varies with atomic
number. The Model 3000 ADF Detector captures these highly
scattered electrons yielding both atomic-resolution imaging
and Z-contrast information.
The Fischione Model 3000 Annular Dark Field (ADF) Detector
incorporates a single crystal yttrium aluminum perovskite
(YAP) scintillator optically coupled to a photomultiplier