Application notes

Looking for help with preparing a sample or specimen for electron microscopy? The links on this page will lead you to applications notes for various instruments. On these pages you will find instrument specific tips, as well as preparation parameters for various materials. If you don't find the specific material you are trying to prepare, contact applications@fischione.com for assistance.

• Conventional preparation
• Plasma cleaning
• Ion beam preparation
• Imaging

Conventional preparation
Silicon plan view specimen preparation for transmission electron microscopy	Model 160 Specimen Grinder Model 170 Ultrasonic Disk Cutter Model 200 Dimpling Grinder
Silicon cross-section specimen preparation for transmission electron microscopy	Model 160 Specimen Grinder Model 170 Ultrasonic Disk Cutter Model 180 XTEM Prep Kit Model 200 Dimpling Grinder
Cutting disk specimens for transmission electron microscopy	Model 170 Ultrasonic Disk Cutter

Plasma cleaning
Plasma cleaning of carbon films for transmission electron microscopy	Model 1020 Plasma Cleaner Model 1070 NanoClean
Effect of plama cleaning on carbon support films for field emission gun transmission electron microscopy	Model 1020 Plasma Cleaner  Model 1070 NanoClean

Ion beam preparation
Model 1040 NanoMill® TEM specimen preparation system specimen configuration	Model 1040 NanoMill® TEM specimen preparation system
Removal of amorphous layer from nanoneedle specimens fabricated by focused ion beam	Model 1040 NanoMill® TEM specimen preparation system
Microelectronic device delayering using an adjustable broad‑beam ion source	Model 1040 NanoMill® TEM specimen preparation system Model 1061 SEM Mill
Shale plan view sample preparation for scanning electron microscopy	Model 1061 SEM Mill
Semiconductor sample preparation for scanning electron microscopy	Model 1061 SEM Mill
Preparation of a copper plate sample for scanning electron microscopy	Model 1061 SEM Mill
Metal plan view sample preparation for electron backscatter diffraction analysis	Model 1061 SEM Mill
Multiscale imaging of shale samples in the scanning electron microscope	Model 1061 SEM Mill
Metallic sample preparation for EBSD by mechanical method and argon ion beam milling	Model 1061 SEM Mill
Preparing cross sections of materials with very different mechanical properties	Model 1061 SEM Mill
Cross-section sample preparation using argon ion milling of a diphase paint coating on a polymer substrate	Model 1061 SEM Mill

Imaging
Annular Dark Field Detector operating principles	Model 3000 Annular Dark Field (ADF) Detector

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