Application notes

Looking for help with preparing a sample or specimen for electron microscopy? The links on this page will lead you to applications notes for various instruments. On these pages you will find instrument specific tips, as well as preparation parameters for various materials. If you don't find the specific material you are trying to prepare, contact applications@fischione.com for assistance.

• Conventional preparation
• Plasma cleaning
• Ion beam preparation
• Imaging

Conventional preparation
The role of TEM specimen preparation in understanding aluminum alloy precipitation hardening mechanism	Model 110 Automatic Twin-Jet Electropolisher Model 1040 NanoMill® TEM specimen preparation system
Silicon plan view specimen preparation for transmission electron microscopy	Model 160 Specimen Grinder Model 170 Ultrasonic Disk Cutter Model 200 Dimpling Grinder
Silicon cross-section specimen preparation for transmission electron microscopy	Model 160 Specimen Grinder Model 170 Ultrasonic Disk Cutter Model 180 XTEM Prep Kit Model 200 Dimpling Grinder
Cutting disk specimens for transmission electron microscopy	Model 170 Ultrasonic Disk Cutter

Plasma cleaning
Plasma cleaning of carbon films for transmission electron microscopy	Model 1020 Plasma Cleaner Model 1070 NanoClean
Preparing hydrophilic, carbon-supported grids for cryo electron microscopy	Model 1070 NanoClean

Ion beam preparation
The role of TEM specimen preparation in understanding aluminum alloy precipitation hardening mechanism	Model 110 Automatic Twin-Jet Electropolisher   Model 1040 NanoMill® TEM specimen preparation system
Model 1040 NanoMill® TEM specimen preparation system specimen configuration	Model 1040 NanoMill® TEM specimen preparation system
Removal of amorphous layer from nanoneedle specimens fabricated by focused ion beam	Model 1040 NanoMill® TEM specimen preparation system
Solder bump sample preparation for failure analysis	Model 1061 SEM Mill
Model 1080 PicoMill® TEM specimen preparation system specimen configuration	Model 1080 PicoMill® TEM specimen preparation system

Imaging
Annular Dark Field Detector operating principles	Model 3000 Annular Dark Field (ADF) Detector

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