Fischione Instruments offers a sample submission program to which you can submit samples for preparation on any of the following instruments:
- Model 1040 NanoMill® TEM specimen preparation system
- Model 1051 TEM Mill
- Model 1061 SEM Mill
- Model 1063 WaferMill™ ion beam delayering solution
- Model 1080 PicoMill® TEM specimen preparation system
Contact your local Fischione Instrument sales representative for more information. For program eligibility, you must submit your samples through your local sales representative; samples submitted directly to Fischione Instruments without a sales contact will not be accepted.
If directed by your Fischione Instruments sales representative, download the sample submission form and complete it. Follow the instructions on the form for submitting the samples.