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Model 160

Specimen Grinder

Conventional specimen preparation

Mechanically prethins specimens for transmission electron microscopy. Produces uniform thickness specimens with parallel sides. Greatly reduces the time spent during the final preparation process of ion beam milling.

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Specimen Grinder

For transmission electron microscopy, the quality of the initial disk determines the quality of the final specimen. The disk can be mechanically ground using the Model 160 Specimen Grinder to a precisely controlled thickness. Use the Model 200 Dimpling Grinder for final thinning.

  • Accurate and dependable
  • Precisely controlled
  • Specimens up to 18 mm diameter
  • No additional force needed
  • Large diameter provides excellent stability
  • Platen transferable to the Model 200 Dimpling Grinder

Silicon cross-section specimen preparation for transmission electron microscopy

Proper preparation of specimens improves the quality of the resulting transmission electron microscope images.

Silicon plan view specimen preparation for transmission electron microscopy

Proper preparation of samples for ion milling increases milling process speed and improves the quality of the resulting transmission electron microscope images.

Characterization of small-scale surface topography using transmission electron microscopy

Multi-scale surface topography is critical to surface function, yet the very smallest scales of topography are not accessible with conventional measurement techniques. Here we demonstrate two separate approaches for measuring small-scale topography in a transmission electron microscope (TEM). The first technique...

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