Thinning to electron transparency
Ion milling is used on physical science specimens to reduce their thickness to electron transparency. Inert gas, typically argon, is ionized and then accelerated toward the specimen surface. By means of momentum transfer, the impinging ions sputter material from the specimen at a controlled rate. Liquid nitrogen cooling of the specimen stage is highly effective in eliminating artifacts.
Advanced ion source technology
Two TrueFocus ion sources direct controlled-diameter ion beams to the specimen regardless of energy. The unique design of the TrueFocus ion source maintains a small ion beam diameter, even at a low accelerating voltage. The ion beams can be focused on either one or both specimen surfaces. When operated in the upper energy range (up to 6.0keV), milling is rapid, even at low angles. When operated at low energy (as low as 100eV), material is gradually sputtered from the specimen without inducing artifacts.
Programmable, automatic operation
The Model 1050 operates with minimal user intervention. It features a modular design for basic instrument operation or fully automated control. The universal control platform manages total instrument operation. The basic version of the Model 1050 is for users who require only primary level instrumentation function. The premium version of the Model 1050 adds full computer control for setting, operating, and recording a broad variety of instrument parameters. The ion milling process can be automatically terminated by temperature, by elapsed time, or by a laser photodetection system.
The Model 1050 TEM Mill accepts a stereo microscope to enhance specimen viewing. The microscope's long working distance allows the specimen to be observed in situ while milling. The Model 1050 can be configured with an imaging system including a high magnification microscope coupled to a CCD camera and video monitor to capture and display images.