Model 200
Dimpling Grinder
An easy-to-use, state-of-the-art, mechanical thinning instrument designed for the reproducible preparation of high-quality transmission electron microscopy specimens
High-quality specimens for transmission electron microscopy need to have a large electron transparent area for analysis, but be rugged. One method that accomplishes both prerequisites is dimpling.
Dimpling is a rapid technique that involves simultaneously rotating the specimen on one axis and a grinding wheel on a perpendicular and intersecting axis. This combination of motions provides a specimen with its central area reduced to a thickness of a few microns. By thinning only the central area of the specimen, a thick, rugged outer rim remains, eliminating the need for special handling techniques for fragile specimens. An abrasive slurry that is in contact with the grinding wheel and the specimen removes the material.
- Prethin specimens for ion milling
- Polish specimens to electron transparency
- Controlled grinding force and rate
- Vibration-free grinding
- Precise indication of specimen thickness
- Easy to program
- Accepts mounted specimens from the Model 160 Specimen Grinder
- Optional 40X microscope attachment
- Allows direct observation of the specimen without the need to remove it
Characterization of small-scale surface topography using transmission electron microscopy
Multi-scale surface topography is critical to surface function, yet the very smallest scales of topography are not accessible with conventional measurement techniques. Here we demonstrate two separate approaches for measuring small-scale topography in a transmission electron microscope (TEM). The first technique...