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Sample preparation instruments for electron microscopy

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15
May

Webinar

An easier, faster, and more accurate Ar ion milling technique for TEM specimen preparation

Presenter:
Cecile Bonifacio, Fischione Instruments

Thursday, May 15, 2025
1 p.m. EDT

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27
July

2025 M&M

Microscopy & Microanalysis 2025

July 27 – July 31, 2025
Salt Lake City, UT USA

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